Semiconductor Engineering Services

Expert 7nm, 5nm, and 3nm FinFET design and verification services based in Bangalore, India.

7nm FinFET 5nm Specialists 3nm Gate-All-Around (GAA) 12nm/16nm Legacy Nodes

Physical Design (PD)

Our Physical Design services cover the entire RTL-to-GDSII cycle. We excel in complex hierarchical designs, multi-corner multi-mode (MMMC) scenarios, and low-power implementation.

  • ▹ Floorplanning and Partitioning
  • ▹ Power Grid Design
  • ▹ Placement and Routing (P&R)
  • ▹ Clock Tree Synthesis (CTS)
  • ▹ In-design DRC and LVS closure
Physical Design Layout Visualization

Analog Layout

Specialized in high-performance analog and mixed-signal layouts. We provide precision designs for SerDes, PLLs, DACs, ADCs, and power management units (PMUs).

  • ▹ Matching and Shielding
  • ▹ Parasitic Extraction (PEX) optimization
  • ▹ Device matching for 7nm/5nm nodes
  • ▹ Guard-ring and Latch-up prevention
Analog Circuit Layout

Physical Verification & Reliability

Comprehensive verification to ensure manufacturability and long-term device stability. We use industry-standard tools to catch potential failures before tape-out.

  • ▹ Design Rule Check (DRC)
  • ▹ Layout Vs Schematic (LVS)
  • ▹ Antenna Checks and Filler Insertion
  • ▹ EMIR analysis and PPA optimization
Verification Visualization

Static Timing Analysis (STA)

Critical timing closure services to meet high-performance targets in advanced nodes. We specialize in MMMC analysis and post-layout timing fixes.

  • ▹ Constraint Management (SDC)
  • ▹ Cross-talk analysis and repair
  • ▹ Sign-off ECO (Engineering Change Order) flows
  • ▹ Variation-aware timing analysis
Timing Diagram Visualization

Our Specialized Focus Areas

Memory Layout

High-density memory compiler layout, bitcell extraction, and custom memory bank organization.

Standard Cell Design

Custom library characterization, layout optimization, and multi-track cell architectures.

DFT (Design for Test)

Scan insertion, ATPG, and logic BIST integration for high-quality manufacturing test coverage.